Test, Reliability and Functional Safety Trends for Automotive System-on-Chip

F. Angione, D. Appello, J. Aribido, J. Athavale, N. Bellarmino, P. Bernardi, R. Cantoro, C. De Sio, T. Foscale, G. Gavarini, J. Guerrero, M. Huch, G. Iaria, T. Kilian, R. Mariani, R. Martone, A. Ruospo, E. Sanchez, U. Schlichtmann, G. Squillero, M. Sonza Reorda, L. Sterpone, V. Tancorre, R. Ugioli (2022) Test, Reliability and Functional Safety Trends for Automotive System-on-Chip, In: 2022 IEEE European Test Symposium (ETS), pp. 1-10, ISBN: 978-1-6654-6706-3