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    • 10th SmartData@PoliTO Workshop – Present and Future Directions
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  • Workshops
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      • Empowering Data Owners with Control in Outsourcing and Sharing Scenarios
      • Language Models for Discovery through Search
    • SmartTalks
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    • PhD Course: Topological Data Analysis
    • PhD Course: Data Science for Networks
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Home » Publications » Post-Silicon Validation of IEEE 1687 Reconfigurable Scan Networks

Post-Silicon Validation of IEEE 1687 Reconfigurable Scan Networks

Aleksa Damljanovic, Artur Jutman, Giovanni Squillero, Anton Tsertov (2019) Post-Silicon Validation of IEEE 1687 Reconfigurable Scan Networks, In: Proceedings - 2019 IEEE European Test Symposium (ETS)

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