Test-Plan Optimization for Flying-Probes In-Circuit Testers

Luciano Bonaria, Maurizio Raganato, Giovanni Squillero, Matteo Sonza Reorda (2019) Test-Plan Optimization for Flying-Probes In-Circuit Testers, In: 2019 IEEE International Test Conference in Asia (ITC-Asia), pp. 19-24, ISBN: 978-1-7281-4718-5