Experimental Evidence for Local Fading Memory Effects in TaOx ReRAM Cells

N. Schmitt, I. Messaris, A. S. Demirkol, V. Ntinas, D. Prousalis, R. Tetzlaff, A. Ascoli, F. Corinto, M. Gilli, S. Zhang, S. Menzel, V. Rana, L. O. Chua (2024) Experimental Evidence for Local Fading Memory Effects in TaOx ReRAM Cells, In: 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) : Proceedings, pp. 1083-1088, ISBN: 979-8-3503-7800-9