A dynamic greedy test scheduler for optimizing probe motion in in-circuit testers

L. Bonaria, M. Raganato, M. Sonza Reorda, G. Squillero (2019) A dynamic greedy test scheduler for optimizing probe motion in in-circuit testers, In: Proceedings of the European Test Symposium, pp. 1-2, ISBN: 978-1-7281-1173-5